Jing is a Master’s student in Computer Science at Leiden University. Prior to this, she obtained her Bachelor’s and Master’s degrees in Electronic Engineering from Nanjing University of Science and Technology and Harbin Institute of Technology. She is currently working as a Data Engineer Intern in the CS-ABS DUV Defectivity team at ASML, where she focuses on identifying patterns in lithography scanner machine data to reduce defectivity. Her interests lie in applying data mining methods to address real-world industrial problems.